Coverity Scan: kulp/tenyr

Project Name kulp/tenyr
Lines of code analyzed 30,540
On Coverity Scan since Jun 30, 2015
Last build analyzed a while ago
   
Language C/C++
Repository URL https://github.com/kulp/tenyr.git
Homepage URL http://tenyr.info
License MIT (MIT license )

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Analysis Metrics

Version: 72ed82d

May 09, 2020
Last Analyzed
30,540
Lines of Code Analyzed
26,243
Lines of Code in Selected Components
0.34
Defect Density

Defect changes since previous build dated Apr 29, 2020

3
Newly detected
1
Eliminated

Defects by status for current build

65
Total defects
9
Outstanding
53
Fixed
See how defect density for 'kulp/tenyr' compares with defect density for other open source projects.  Learn more

Note: Defect density is measured by the number of defects per 1,000 lines of code.


Analysis Metrics per Components

Component Name Pattern Ignore Line of Code Defect density
simulated devices .*/devices/.* No 582 0.00
VPI support .*/vpi/.* No 208 0.00
parser .*/build/.*/parser.c Yes 2,350 N/A
lexer .*/build/.*/lexer.c Yes 1,947 N/A
third-party code .*/3rdparty/.* Yes 0 N/A
assembler .*/src/(tas|asm).* No 1,036 0.00
simulator .*/src/(tsim|sim).* No 754 1.33
JIT .*/src/jit\..* No 176 0.00
Other .* No 64,247 0.03

CWE Top 25 defects

No top 25 CWE defects were found.

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